Archive for 'Electronics Components'
The Benefits of RFID Technology
Posted on 11. Jul, 2011 by Admin.
RFID is a general term used for describing a system transmitting the identity of products and services through radio waves. It is one of the latest and most effective automatic identification technologies. The main purpose of RFID technology is to enable data to be transmitted by any portable device generally referred to as a tag, which is read by an RFID reader and then processed as required by the application. It has gained worldwide attention since it can be used to track moving objects with accuracy. [...]
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RFID, Radio Frequency Identification and Detection
Posted on 10. Jul, 2011 by Admin.
RFID is a tracking technology used to identify and authenticate tags that are applied to any product, individual or animal. Radio frequency Identification and Detection is a general term used for technologies that make use of radio waves in order to identify objects and people.
Purpose of Radio frequency Identification and Detection system is to facilitate data transmission through the portable device known as tag that is read with the help of RFID reader; and process it as per the needs of an application. Information transmitted with the help of tag offers location or identification along with other specifics of product tagged – purchase date, color, and price. Typical RFID tag includes microchip with radio antenna, mounted on substrate. [...]
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What is the work way of Motor run Capacitor?
Posted on 09. Jul, 2011 by Admin.
Capacitor is a device for storing an electrical charge. In a way, a capacitor is a little like a battery. Although they work in completely different ways, capacitors and batteries both store electrical energy. If you have read how batteries work, then you know that a battery has two terminals. Inside the battery, chemical reactions produce electrons on one terminal and absorb electrons at the other terminal. A capacitor is a much simpler device, and it cannot produce new electrons — it only stores them. A capacitor consists two metal plates insulated from each other. When opened, the inside looks like two sheets of foil with wax paper in between them and rolled tight, similar to a roll of paper towel. Years ago the oil filled type used PCB’s as a coolant. Today most capacitors are the dry type. [...]
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Fundamentals of Semiconductor C-V Measurements
Posted on 05. Jul, 2011 by Admin.
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies can also be characterized with C-V measurements, including bipolar junction transistors (BJTs), JFETs, III-V compound devices, photovoltaic cells, MEMs devices, organic TFT displays, photodiodes, carbon nanotubes (CNTs), and many others.
The fundamental nature of these measurements makes them useful in a wide range of applications and disciplines. They are used in the research labs of universities and semiconductor manufacturers to evaluate new materials, processes, devices, and circuits. C-V measurements are extremely important to product and yield enhancement engineers, who are responsible for improving processes and device performance. Reliability engineers use these measurements to qualify material suppliers, monitor process parameters, and analyze failure mechanisms. [...]
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Evolution of Semiconductor Parameter Analyzers for 3 Critical Types of Semiconductor Measurement
Posted on 03. Jul, 2011 by Admin.
Characterizing a semiconductor device, material, or process thoroughly requires the ability to make three types of measurements. The first two types, DC I-V and AC impedance measurements, are the most familiar to semiconductor manufacturers. Precision DC I-V measurements are typically made with high-precision Source-Measure Units (SMUs) to generate current vs. voltage curves. (SMUs can source and measure both current and voltage.) AC impedance measurements in the semiconductor industry are often made with a capacitance meter. Ultra-fast (transient) I-V is the third type of semiconductor characterization testing, and the one most difficult to achieve. Historically, semiconductor labs have used up to three different test systems to obtain all three types of measurement. [...]